共 50 条
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- [28] Thermo-Compression Bonding Assembly Process and Reliability Studies of Cu Pillar Bump on Cu/Low-K Chip 2014 IEEE 16TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC), 2014, : 574 - 578
- [29] Dynamic finite element analysis on underlay microstructure of Cu/low-K wafer during bonding process 2007 INTERNATIONAL CONFERENCE ON ELECTRONIC MATERIALS AND PACKAGING, 2007, : 383 - +
- [30] Plasma process-induced wire-to-wire leakage current for low-k SiOC/Cu damascene structure. 2002 7TH INTERNATIONAL SYMPOSIUM ON PLASMA- AND PROCESS-INDUCED DAMAGE, 2002, : 162 - 165