All-Digital 0.016mm2 Reconfigurable Sensor-ADC Using 4CKES-TAD in 65nm Digital CMOS

被引：0
|
作者：
Watanabe, Takamoto [1 ]
Hou, Yu [2 ]
Miyahara, Masaya [2 ]
Matsuzawa, Akira [2 ]
机构：
[1] DENSO CORP, Kariya, Aichi, Japan
[2] Tokyo Inst Technol, Tokyo, Japan
来源：
2014 21ST IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS (ICECS) | 2014年
关键词：
RESOLUTION; CONVERTER; POWER;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An all-digital reconfigurable (10-to-16-bit) sensor ADC based on TAD (Time A/D converter) is completely digital, using a ring-delay-line RDL driven by an input voltage V-in as its power supply. This method realized 16.2bit/100ksps/37.5 mu W from 0.6V supply without any static current using a 0.016mm(2) prototype 4CKES (4-clock-edge-shift) TAD in a 65nm digital CMOS. Resolutions can be controlled by setting its conversion time T-cv. A 13.8bit/1Msps/75.4 mu W or 10.5bit/10Msps/93.2 mu W operation is also experimentally confirmed using 0.6V supply. Finally, correction of nonlinearity characteristics has been discussed using differential-setup processing method.
引用
收藏
页码：21 / 24
页数：4
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