A Parametric Model for the Measurement of Linear Magnitudes in Non-Contact CMM

被引:0
|
作者
Vazquez, J. M. [1 ]
Garcia, D. [1 ]
Garofano, J. E. [1 ]
Contreras, J. P. [1 ]
Marcos, M. [1 ]
机构
[1] Univ Cadiz, Fac Engn, Ind Metrol Ctr, Cadiz 11002, Spain
关键词
Non Contact CMM; Linear Magnitudes; Parametric Model; Regression;
D O I
10.1063/1.4707561
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Research work has been carried out to determine an approach to a relationship that made possible to the most suitable configuration for non-contact coordinate measure machines (CMM) in order to obtain high quality measurements of linear magnitudes. This paper describes the development of a parametric model between the optical magnification, the length of samples and the values obtained of correction and uncertainty of the measures. For this purpose, an experimental methodology has been designed for obtaining on the most appropriate conditions the data that will be subject of this work. The experimental results indicate that the optical amplification and the length of the sample are the most significant factors affecting the uncertainty of the measures. The model presented in this paper has been determined through approximations to multivariate regression expressions and can be great assistance in the choice of the most appropriate input parameters to setup the measurement device.
引用
收藏
页码:151 / 157
页数:7
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