A Reliable Fault Classifier for Dependable Systems on SRAM-based FPGAs

被引：0

作者：

Bolchini, Cristiana ^{[1
]}

Sandionigi, Chiara ^{[1
]}

Fossati, Luca ^{[2
]}

Codinachs, David Merodio ^{[2
]}

机构：

[1] Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy

[2] European Space Agcy, NL-2200 AG Noordwijk, Netherlands

来源：

2011 IEEE 17TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS) | 2011年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery possibility; some faults can be recovered by reconfiguring the faulty part of the device, others have a destructive effect. After classification has been carried out, the suitable fault recovery strategy is applied, with the final aim of enabling the exploitation of FPGAs, in particular SRAM-based ones, for critical applications, such as the ones in the space environment. In this scenario, we investigate the reliable implementation of the fault classification algorithm, that can be so integrated in an overall reliable system.

引用

页数：6

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