On removing redundant faults in synchronous sequential circuits

被引：0

作者：

Lin, XJ ^{[1
]}

Pomeranz, I ^{[1
]}

Reddy, SM ^{[1
]}

机构：

[1] Univ Iowa, Dept Elect & Comp Engn, Iowa City, IA 52242 USA

来源：

16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 1998年

关键词：

D O I：

10.1109/VTEST.1998.670865

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

We describe a time-efficient procedure for removing sequentially redundant faults from synchronous sequential circuits with synchronizing sequences. We use properties of redundant faults and propose several methods to identify subsets of redundant faults that can be removed simultaneously from the circuit. By removing several redundant faults simultaneously, the number of repetitions of the test generation procedure invoiced to identify redundant faults is reduced. Experimental results presented in this work demonstrate the effectiveness of the proposed removal procedure.

引用

页码：168 / 175

页数：8

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