The Reproducibility Improving Method of System-level ESD test Through Operating Program Workload Analysis

It is well known that the system-level ESD tests suffer from poor reproducibility. Reproducibility problems appear in various cases; in different systems and the different ESD guns, even if the ESD test conducted using the same systems and ESD guns. This paper is proposed the method which can improve the reproducibility of the system-level ESD test at the same system. The operating state of DRAM is very important factor to the ESD failure level by measuring the signals of memory modules during an ESD event. The soft failure is observed when there is a signal toggling during an ESD event. Through the experiment of program workload, it is confirmed there is a strong correlation between the program workload and the reproducibility of ESD test result. The reproducibility of the system-level ESD test can be improved by maximizing the program workload.