S-Parameter Based Modeling of System-level ESD Test Bed

被引：0
|
作者：
Xiu, Yang [1 ]
Thomson, Nicholas [1 ]
Mertens, Robert [1 ]
Rosenbaum, Elyse [1 ]
机构：
[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA
来源：
2015 37TH ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM (EOS/ESD) | 2015年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The IEC 61000-4-2 test bed is modeled with circuit elements extracted from S-parameter measurements. Simulated current waveforms are consistent with measurement for both battery operated and tethered equipment-under-test without customizing the model parameters for each case.
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页数：10
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