Design for diagnosability of CMOS circuits

被引：3

作者：

Wen, XQ ^{[1
]}

Honzawa, T ^{[1
]}

Tamamoto, H ^{[1
]}

Saluja, KK ^{[1
]}

Kinoshita, K ^{[1
]}

机构：

[1] SynTest Technol Inc, Sunnyvale, CA 94086 USA

来源：

SEVENTH ASIAN TEST SYMPOSIUM (ATS'98), PROCEEDINGS | 1998年

关键词：

D O I：

10.1109/ATS.1998.741605

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper presents a new approach to improvising the diagnosability of a CMOS circuit by dividing into independent partitions and using a separate power supply for each partition. This technique makes it possible to implement multiple I-DDQ measurement points. As a result the diagnosability of the circuit can be improved. The problem of partitioning a circuit is addressed and optimum and heuristic solutions are proposed. The effectiveness of our approach is demonstrated through experimental results.

引用

页码：144 / 149

页数：6

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