Design for diagnosability of CMOS circuits

被引：3
|
作者：
Wen, XQ [1 ]
Honzawa, T [1 ]
Tamamoto, H [1 ]
Saluja, KK [1 ]
Kinoshita, K [1 ]
机构：
[1] SynTest Technol Inc, Sunnyvale, CA 94086 USA
来源：
SEVENTH ASIAN TEST SYMPOSIUM (ATS'98), PROCEEDINGS | 1998年
关键词：
D O I：
10.1109/ATS.1998.741605
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper presents a new approach to improvising the diagnosability of a CMOS circuit by dividing into independent partitions and using a separate power supply for each partition. This technique makes it possible to implement multiple I-DDQ measurement points. As a result the diagnosability of the circuit can be improved. The problem of partitioning a circuit is addressed and optimum and heuristic solutions are proposed. The effectiveness of our approach is demonstrated through experimental results.
引用
收藏
页码：144 / 149
页数：6
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