The impact of the P-pillar structure design on Breakdown Voltage for 1.2kV 4H-SiC Superjunction DMOSFET

被引:3
|
作者
Lee, Yuan-Chen [1 ]
Lin, Kai-Hsun [1 ]
Lee, Kung-Yen [1 ]
机构
[1] Natl Taiwan Univ, Dept Engn Sci & Ocean Engn, Taipei, Taiwan
关键词
4H-SiC power MOSFET; super junction; DMOSFET; breakdown voltage; charge balance; electric field distribution;
D O I
10.1109/IEEEC53238.2021.9661656
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
1.2kV-class 4H-SiC super junction (SJ) DMOSFET was designed and optimized in this work. Several P-pillar structures and dosage variation were used to target the charge balance condition in order to optimize breakdown voltage (BV) with low specific on-resistance (R-on,R-sp). Vertical electric field distribution of SJ DMOSFET performs a relatively uniform distribution compared with planer DMOSFET. Horizontal electric field distribution shows a peak value at the junction of N and P pillar, while the electric field distribution decline rate affects the final BV value effectively. In this study, we demonstrated the impact of adjusting the P-pillar width and scaling down the device on BV through a series of electric field analysis.
引用
收藏
页数:4
相关论文
共 50 条
  • [41] A 4H-SiC semi-super-junction shielded trench MOSFET:p-pillar is grounded to optimize the electric field characteristics
    Xiaojie Wang
    Zhanwei Shen
    Guoliang Zhang
    Yuyang Miao
    Tiange Li
    Xiaogang Zhu
    Jiafa Cai
    Rongdun Hong
    Xiaping Chen
    Dingqu Lin
    Shaoxiong Wu
    Yuning Zhang
    Deyi Fu
    Zhengyun Wu
    Feng Zhang
    Journal of Semiconductors, 2022, 43 (12) : 83 - 91
  • [42] A 4H-SiC semi-super-junction shielded trench MOSFET: p-pillar is grounded to optimize the electric field characteristics
    Wang, Xiaojie
    Shen, Zhanwei
    Zhang, Guoliang
    Miao, Yuyang
    Li, Tiange
    Zhu, Xiaogang
    Cai, Jiafa
    Hong, Rongdun
    Chen, Xiaping
    Lin, Dingqu
    Wu, Shaoxiong
    Zhang, Yuning
    Fu, Deyi
    Wu, Zhengyun
    Zhang, Feng
    JOURNAL OF SEMICONDUCTORS, 2022, 43 (12)
  • [43] A 4H-SiC semi-super-junction shielded trench MOSFET:p-pillar is grounded to optimize the electric field characteristics
    Xiaojie Wang
    Zhanwei Shen
    Guoliang Zhang
    Yuyang Miao
    Tiange Li
    Xiaogang Zhu
    Jiafa Cai
    Rongdun Hong
    Xiaping Chen
    Dingqu Lin
    Shaoxiong Wu
    Yuning Zhang
    Deyi Fu
    Zhengyun Wu
    Feng Zhang
    Journal of Semiconductors, 2022, (12) : 83 - 91
  • [44] Breakdown voltage capability of vertical 4H-SiC power devices
    Godignon, Philippe
    Biscarrat, Jerome
    Tranchesset, Miya
    Lavieville, Romain
    Tournier, Dominique
    Brosselard, Pierre
    Montserrat, Josep
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2024, 178
  • [45] Physics-based simulation of 4H-SIC DMOSFET structure under inductive switching
    Bejoy N. Pushpakaran
    Stephen B. Bayne
    Aderinto A. Ogunniyi
    Journal of Computational Electronics, 2016, 15 : 191 - 199
  • [46] Design and Simulation of 600V 4H-SiC Superjunction JBS Diode
    Luo, Xixi
    Huang, Alex Q.
    2019 IEEE 7TH WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS (WIPDA 2019), 2019, : 121 - 124
  • [47] High-voltage (3 kV) UMOSFETs in 4H-SiC
    Li, Y
    Cooper, JA
    Capano, MA
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2002, 49 (06) : 972 - 975
  • [48] 4H-SiC/SiO2 Interface Degradation in 1.2 kV 4H-SiC MOSFETs Due to Power Cycling Tests
    Yoo, Dahui
    Kim, Mijin
    Kang, Inho
    Lee, Ho-Jun
    ELECTRONICS, 2024, 13 (07)
  • [49] 1.2-kV 4H-SiC JBS Diodes Engaging P-Type Retrograde Implants
    Zhang, Yuan-Lan
    Liu, Peng-Fei
    Zhang, Jie
    Ma, Hong-Ping
    Liu, Jian-Hua
    Liu, Qi-Bin
    Chen, Zhong-Guo
    Zhang, Qingchun J.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2022, 69 (12) : 6963 - 6970
  • [50] Design and fabrication of a 3.3 kV 4H-SiC MOSFET
    Huang Runhua
    Tao Yonghong
    Bai Song
    Chen Gang
    Wang Ling
    Liu Ao
    Wei Neng
    Li Yun
    Zhao Zhifei
    JOURNAL OF SEMICONDUCTORS, 2015, 36 (09)