共 50 条
- [35] Simulation study of 1.2 kV 4H-SiC DIMOSFET structures 2004: 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, VOLS 1- 3, PROCEEDINGS, 2004, : 2341 - 2344
- [36] Influence of Surface Roughness on Breakdown Voltage of 4H-SiC SBD with FLR Structure SILICON CARBIDE AND RELATED MATERIALS 2008, 2009, 615-617 : 643 - 646
- [37] Temperature and Time Dependent Threshold Voltage Instability in 4H-SiC Power DMOSFET Devices SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2, 2009, 600-603 : 1147 - +