Autonomous calibration method of the reference flat surface of an interferometer without using a standard flat surface

被引:15
|
作者
Fujimoto, Ikumatsu [1 ]
Takatsuji, Toshiyuki [2 ]
Nishimura, Kunitoshi [3 ]
Kim, Min Young [4 ]
机构
[1] Okuwa Tech Res Ctr, Kazo, Saitama 3470032, Japan
[2] Natl Inst Adv Ind Sci & Technol, Natl Metrol Inst Japan NMIJ, Tsukuba, Ibaraki 3058568, Japan
[3] Mizukoshi Keiki Co Ltd, Nakahara Ku, Mitaka, Tokyo 1810005, Japan
[4] Kyungpook Natl Univ, Sch Elect Engn, IT Coll, Taegu 702701, South Korea
关键词
D O I
10.1364/AO.51.004754
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
An autonomous method for calibrating the reference flat surface of an interferometer is proposed with the uncertainty analysis. The method consists of three phases; the first step is multiple rotating shifts of a specimen, the second is a linear shift, and the last is multiple rotating shifts again. The profile of the reference flat surface is basically determined by the linear shift. The linear shift errors that occurred during the linear shift are identified by the rotating shifts. The rotating shift errors caused by the rotating shifts can be compensated and the residual uncertainty can be reduced in proportion to the square root of the number of rotating shifts per one revolution. Finally, the uncertainty analysis is carried out in detail. (C) 2012 Optical Society of America
引用
收藏
页码:4754 / 4767
页数:14
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