A State Recovery Design against Single-Event Transient in High-speed Phase Interpolation Clock and Data Recovery Circuit

被引：0

作者：

Tan, Jiawei ^{[1
]}

Guo, Yang ^{[1
]}

Chen, Jianjun ^{[1
]}

Yuan, Hengzhou ^{[1
]}

Chen, Xi ^{[1
]}

机构：

[1] Natl Univ Def Technol, Coll Comp, Changsha 410073, Hunan, Peoples R China

来源：

2017 IEEE 12TH INTERNATIONAL CONFERENCE ON ASIC (ASICON) | 2017年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this thesis, we investigate optimum Radiation Hardened By Design (RHBD) in the Low Pass Filter (LPF) of the all-digital Phase Interpolation Clock and Data Recovery (PICDR) for use against Single-Event Transients (SET). PICDR is a critical circuit in the receiver of high-speed multi-channel Serial-data transceiver systems. Nevertheless, in some particular operating environment, there exist severe challenges for the PICDR. A state-recoverable PICDR is investigated regarding its SET pulse immunities. This state-recoverable PICDR is designed with 65-nm CMOS technology with the Spectre simulation tool, and in consequence it shows as a successful RHBD implementation which is immune to near 90% of the function errors caused by the SET with very low penalties.

引用

页码：339 / 342

页数：4

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