An Efficient Routing Method for Pseudo-Exhaustive Built-in Self-Testing of High-Speed Interconnects

This paper presents a powerful routing method for pseudo-exhaustive built-in self-testing of high-speed interconnects with both capacitive and inductive crosstalk effects. Based on the concepts of test cone and cut-off locality, the routing method can generate an interconnect structure such that all nets can be tested by pseudo-exhaustive patterns. The test pattern generation method is simple and efficient. Experimental results obtained by simulating a set of MCNC benchmarks demonstrate the feasibility of the proposed pseudo-exhaustive test approach and the efficiency of the proposed routing method