A high-speed 32-channel CMOS VCSEL driver with built-in self-test and clock generation circuitry

被引：13
|
作者：
Kiamilev, FE [1 ]
Krishnamoorthy, AV
机构：
[1] Univ N Carolina, Charlotte, NC 28223 USA
[2] AT&T Bell Labs, Lucent Technol, Holmdel, NJ 07733 USA
来源：
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS | 1999年 / 5卷 / 02期
关键词：
D O I：
10.1109/2944.778308
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper describes the design, electrical, and optical test results for a high-speed 32-channel CMOS vertical-cavity surface emitting laser (VCSEL) driver integrated circuits with built-in self-test and clock generation circuitry. The circuit design and silicon parts are available to the research community through the Consortium for Optical and Optoelectronic Technologies in Computing (CO-OP) and the Optoelectronics Industry Association (OIDA), This device is specifically targeted at users building VCSEL-based smart photonic system demonstrators. A ten-channel version of this driver chip is also available with the same functionality and performance.
引用
收藏
页码：287 / 295
页数：9
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