High level test generation for custom hardware: An industrial perspective

被引：0
|
作者：
Ghosh, I [1 ]
机构：
[1] Fujitsu Labs Amer, Sunnyvale, CA 94085 USA
来源：
14TH ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2005年
关键词：
RTL; ATPG; testing; validation; fault-coverage; fault simulation; functional test;
D O I：
10.1109/ATS.2005.65
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：458 / 458
页数：1
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