Nanopillars and arrays of nanoholes fabricated by extreme ultraviolet interferometric laser lithography

被引:0
|
作者
Wachulak, P. W. [1 ]
Capeluto, M. G. [2 ]
Patel, D. [1 ]
Marconi, M. C. [1 ]
Menoni, C. S. [1 ]
Rocca, J. J. [1 ]
机构
[1] Colorado State Univ, NSF, ERC Extreme Ultraviolet Sci & Technol, Ft Collins, CO 80523 USA
[2] Univ Buenos Aires, Fac Ciencias Exactas, Dept Fis, RA-1053 Buenos Aires, DF, Argentina
关键词
D O I
10.1109/LEOS.2007.4382491
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Arrays of holes and pillars were fabricated by multiple exposure interferometric lithography using a table top lambda=46.9 nm wavelength laser. Size and the feature characteristic is controlled changing the applied exposure dose.
引用
收藏
页码:486 / +
页数:2
相关论文
共 50 条
  • [31] Directing osteoblastic cell migration on arrays of nanopillars and nanoholes with different aspect ratios
    Cheng, Yijun
    Zhu, Shuyan
    Pang, Stella W.
    LAB ON A CHIP, 2021, 21 (11) : 2206 - 2216
  • [32] Diffraction-assisted extreme ultraviolet proximity lithography for fabrication of nanophotonic arrays
    Danylyuk, Serhiy
    Kim, Hyun-su
    Brose, Sascha
    Dittberner, Carsten
    Loosen, Peter
    Taubner, Thomas
    Bergmann, Klaus
    Juschkin, Larissa
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2013, 31 (02):
  • [33] Fabrication of parallel-plate nanomirror arrays for extreme ultraviolet maskless lithography
    Shroff, Y
    Chen, YJ
    Oldham, W
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (06): : 2412 - 2415
  • [34] Estimation of extreme ultraviolet power and throughput for extreme ultraviolet lithography
    Chiba, A.
    Ota, K.
    Ogawa, T.
    Okazaki, S.
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2001, 40 (07): : 4535 - 4539
  • [35] Estimation of extreme ultraviolet power and throughput for extreme ultraviolet lithography
    Chiba, A
    Ota, K
    Ogawa, T
    Okazaki, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (07): : 4535 - 4539
  • [36] Masks for extreme ultraviolet lithography
    Vernon, SP
    Kearney, PA
    Tong, WM
    Prisbrey, S
    Larson, C
    Moore, CE
    Weber, FW
    Cardinale, G
    Yan, PY
    Hector, SD
    18TH ANNUAL SYMPOSIUM ON PHOTOMASK TECHNOLOGY AND MANAGEMENT, 1998, 3546 : 184 - 193
  • [37] More on extreme ultraviolet lithography
    不详
    MATERIALS WORLD, 2008, 16 (05) : 9 - 9
  • [38] Maskless extreme ultraviolet lithography
    J Vac Sci Technol B Microelectron Nanometer Struct, (3047-3051):
  • [39] Photoresist for Extreme Ultraviolet Lithography
    Tao, Peipei
    Sheng, Li
    Wang, Qianqian
    Cui, Hao
    Wang, Xiaolin
    He, Xiangming
    Xu, Hong
    IWAPS 2020: PROCEEDINGS OF 2020 4TH INTERNATIONAL WORKSHOP ON ADVANCED PATTERNING SOLUTIONS (IWAPS), 2020, : 53 - 56
  • [40] Status of Extreme Ultraviolet Lithography
    Kinoshita, Hiroo
    JOURNAL OF BIOMEDICAL NANOTECHNOLOGY, 2006, 2 (02) : 99 - 102