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- [21] Scaling of oxide-based resistive switching devices2014 14TH ANNUAL NON-VOLATILE MEMORY TECHNOLOGY SYMPOSIUM (NVMTS), 2014,Ielmini, D.论文数: 0 引用数: 0 h-index: 0机构: Politecn Milan, Dipartimento Elettron Informaz & Bioingn, Piazza L da Vinci 32, I-20133 Milan, Italy Politecn Milan, Dipartimento Elettron Informaz & Bioingn, Piazza L da Vinci 32, I-20133 Milan, ItalyAmbrogio, S.论文数: 0 引用数: 0 h-index: 0机构: Politecn Milan, Dipartimento Elettron Informaz & Bioingn, Piazza L da Vinci 32, I-20133 Milan, ItalyBalatti, S.论文数: 0 引用数: 0 h-index: 0机构: Politecn Milan, Dipartimento Elettron Informaz & Bioingn, Piazza L da Vinci 32, I-20133 Milan, Italy
- [22] Modeling of Retention Failure Behavior in Bipolar Oxide-Based Resistive Switching MemoryIEEE ELECTRON DEVICE LETTERS, 2011, 32 (03) : 276 - 278Gao, Bin论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaZhang, Haowei论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaChen, Bing论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaLiu, Lifeng论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaLiu, Xiaoyan论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaHan, Ruqi论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaKang, Jinfeng论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaFang, Zheng论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaYu, Hongyu论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaYu, Bin论文数: 0 引用数: 0 h-index: 0机构: SUNY Albany, Coll Nanoscale Sci & Engn, Albany, NY 12203 USA Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaKwong, Dim-Lee论文数: 0 引用数: 0 h-index: 0机构: ASTAR, Inst Microelect, Singapore 117685, Singapore Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R China
- [23] Analytical Modeling of Current Overshoot in Oxide-Based Resistive Switching Memory (RRAM)IEEE ELECTRON DEVICE LETTERS, 2016, 37 (10) : 1268 - 1271Ambrogio, Stefano论文数: 0 引用数: 0 h-index: 0机构: Politecn Milan, Italian Univ Nanoelect Team, Dipartimento Elettron Informaz & Bioingn, I-20133 Milan, Italy Politecn Milan, Italian Univ Nanoelect Team, Dipartimento Elettron Informaz & Bioingn, I-20133 Milan, ItalyMilo, Valerio论文数: 0 引用数: 0 h-index: 0机构: Politecn Milan, Italian Univ Nanoelect Team, Dipartimento Elettron Informaz & Bioingn, I-20133 Milan, Italy Politecn Milan, Italian Univ Nanoelect Team, Dipartimento Elettron Informaz & Bioingn, I-20133 Milan, ItalyWang, ZhongQiang论文数: 0 引用数: 0 h-index: 0机构: Politecn Milan, Dipartimento Elettron Informaz & Bioingn, I-20133 Milan, Italy Politecn Milan, Italian Univ Nanoelect Team, I-20133 Milan, Italy North Eastern Normal Univ, Changchun, Peoples R China Politecn Milan, Italian Univ Nanoelect Team, Dipartimento Elettron Informaz & Bioingn, I-20133 Milan, ItalyBalatti, Simone论文数: 0 引用数: 0 h-index: 0机构: Politecn Milan, Dipartimento Elettron Informaz & Bioingn, I-20133 Milan, Italy Politecn Milan, Italian Univ Nanoelect Team, I-20133 Milan, Italy Intermolecular Inc, San Jose, CA 95134 USA Politecn Milan, Italian Univ Nanoelect Team, Dipartimento Elettron Informaz & Bioingn, I-20133 Milan, ItalyIelmini, Daniele论文数: 0 引用数: 0 h-index: 0机构: Politecn Milan, Italian Univ Nanoelect Team, Dipartimento Elettron Informaz & Bioingn, I-20133 Milan, Italy Politecn Milan, Italian Univ Nanoelect Team, Dipartimento Elettron Informaz & Bioingn, I-20133 Milan, Italy
- [24] Impact of program/erase operation on the performances of oxide-based resistive switching memoryNANOSCALE RESEARCH LETTERS, 2015, 10Wang, Guoming论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China Tianjin Univ Technol, Tianjin Key Lab Film Elect & Commun Devices, Tianjin 300384, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R ChinaLong, Shibing论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R ChinaYu, Zhaoan论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R ChinaZhang, Meiyun论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R ChinaLi, Yang论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R ChinaXu, Dinglin论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R ChinaLv, Hangbing论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R ChinaLiu, Qi论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R ChinaYan, Xiaobing论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R ChinaWang, Ming论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R ChinaXu, Xiaoxin论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R ChinaLiu, Hongtao论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R ChinaYang, Baohe论文数: 0 引用数: 0 h-index: 0机构: Tianjin Univ Technol, Tianjin Key Lab Film Elect & Commun Devices, Tianjin 300384, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R ChinaLiu, Ming论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Lab Nanofabricat & Novel Device Integrat, Inst Microelect, Beijing 100029, Peoples R China
- [25] Binary metal oxide-based resistive switching memory devices: A status reviewMATERIALS TODAY COMMUNICATIONS, 2023, 34Patil, Amitkumar R.论文数: 0 引用数: 0 h-index: 0机构: Shivaji Univ, Dept Phys, Electrochem Mat Lab, Kolhapur 416004, India Shivaji Univ, Dept Phys, Electrochem Mat Lab, Kolhapur 416004, IndiaDongale, Tukaram D.论文数: 0 引用数: 0 h-index: 0机构: Shivaji Univ, Sch Nanosci & Biotechnol, Computat Elect & Nanosci Res Lab, Kolhapur 416004, India Shivaji Univ, Dept Phys, Electrochem Mat Lab, Kolhapur 416004, IndiaKamat, Rajanish K.论文数: 0 引用数: 0 h-index: 0机构: Shivaji Univ, Dept Elect, Kolhapur 416004, India Homi Bhabha State Univ, 15 Madam Cama Rd, Mumbai 400032, India Shivaji Univ, Dept Phys, Electrochem Mat Lab, Kolhapur 416004, IndiaRajpure, Keshav Y.论文数: 0 引用数: 0 h-index: 0机构: Shivaji Univ, Dept Phys, Electrochem Mat Lab, Kolhapur 416004, India Shivaji Univ, Dept Phys, Electrochem Mat Lab, Kolhapur 416004, India
- [26] Impact of program/erase operation on the performances of oxide-based resistive switching memoryNanoscale Research Letters, 2015, 10Guoming Wang论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device IntegrationShibing Long论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device IntegrationZhaoan Yu论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device IntegrationMeiyun Zhang论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device IntegrationYang Li论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device IntegrationDinglin Xu论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device IntegrationHangbing Lv论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device IntegrationQi Liu论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device IntegrationXiaobing Yan论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device IntegrationMing Wang论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device IntegrationXiaoxin Xu论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device IntegrationHongtao Liu论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device IntegrationBaohe Yang论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device IntegrationMing Liu论文数: 0 引用数: 0 h-index: 0机构: Institute of Microelectronics,Lab of Nanofabrication and Novel Device Integration
- [27] Improvement of Resistive Switching Characteristics in Zinc Oxide-Based Resistive Random Access Memory by Ammoniation AnnealingIEEE ELECTRON DEVICE LETTERS, 2020, 41 (03) : 357 - 360Wu, Pei-Yu论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanZheng, Hao-Xuan论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanShih, Chih-Cheng论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanChang, Ting-Chang论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Ctr Crystal Res, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanChen, Wei-Jang论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanYang, Chih-Cheng论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanChen, Wen-Chung论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanTai, Mao-Chou论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Photon, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanTan, Yung-Fang论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanHuang, Hui-Chun论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanMa, Xiao-Hua论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Band Gap Semicond T, Xian 710071, Peoples R China Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanHao, Yue论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Band Gap Semicond T, Xian 710071, Peoples R China Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanTsai, Tsung-Ming论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanSze, Simon M.论文数: 0 引用数: 0 h-index: 0机构: Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu 300, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan
- [28] Influence of deposition pressure of CuTe electrode on the tantalum oxide-based resistive switching memoryMICROELECTRONIC ENGINEERING, 2019, 215Baek, Gwangho论文数: 0 引用数: 0 h-index: 0机构: Hanyang Univ, Div Nanoscale Semicond Engn, Novel Funct Mat & Device Lab, Seoul 04763, South Korea Hanyang Univ, Div Nanoscale Semicond Engn, Novel Funct Mat & Device Lab, Seoul 04763, South KoreaYang, Seungmo论文数: 0 引用数: 0 h-index: 0机构: Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 04763, South Korea Hanyang Univ, Div Nanoscale Semicond Engn, Novel Funct Mat & Device Lab, Seoul 04763, South KoreaKim, Taeyoon论文数: 0 引用数: 0 h-index: 0机构: Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 04763, South Korea Hanyang Univ, Div Nanoscale Semicond Engn, Novel Funct Mat & Device Lab, Seoul 04763, South Korea
- [29] Modeling of conducting bridge evolution in bipolar vanadium oxide-based resistive switching memoryChinese Physics B, 2013, 22 (09) : 558 - 562张楷亮论文数: 0 引用数: 0 h-index: 0机构: School of Electronics Information Engineering,Tianjin Key Laboratory of Film Electronic & Communication Devices,Tianjin University of Technology School of Electronics Information Engineering,Tianjin Key Laboratory of Film Electronic & Communication Devices,Tianjin University of Technology论文数: 引用数: h-index:机构:王芳论文数: 0 引用数: 0 h-index: 0机构: School of Electronics Information Engineering,Tianjin Key Laboratory of Film Electronic & Communication Devices,Tianjin University of Technology School of Electronics Information Engineering,Tianjin University School of Electronics Information Engineering,Tianjin Key Laboratory of Film Electronic & Communication Devices,Tianjin University of Technology尹富红论文数: 0 引用数: 0 h-index: 0机构: School of Electronics Information Engineering,Tianjin Key Laboratory of Film Electronic & Communication Devices,Tianjin University of Technology School of Electronics Information Engineering,Tianjin Key Laboratory of Film Electronic & Communication Devices,Tianjin University of Technology韦晓莹论文数: 0 引用数: 0 h-index: 0机构: School of Electronics Information Engineering,Tianjin University School of Electronics Information Engineering,Tianjin Key Laboratory of Film Electronic & Communication Devices,Tianjin University of Technology赵金石论文数: 0 引用数: 0 h-index: 0机构: School of Electronics Information Engineering,Tianjin Key Laboratory of Film Electronic & Communication Devices,Tianjin University of Technology School of Electronics Information Engineering,Tianjin Key Laboratory of Film Electronic & Communication Devices,Tianjin University of Technology
- [30] INVESTIGATION OF FORMING PROCESS FOR METAL OXIDE-BASED RESISTIVE SWITCHING MEMORY BY STOCHASTIC SIMULATION2014 12TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT), 2014,Huang, Peng论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Beijing 100871, Peoples R ChinaLiu, Xiaoyan论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Beijing 100871, Peoples R ChinaZhao, Yudi论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Beijing 100871, Peoples R ChinaChen, Bing论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Beijing 100871, Peoples R ChinaGao, Bin论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Beijing 100871, Peoples R ChinaDu, Gang论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Beijing 100871, Peoples R ChinaKang, Jinfeng论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Inst Microelect, Beijing 100871, Peoples R China Peking Univ, Inst Microelect, Beijing 100871, Peoples R China