Leakage Characterization of 10T SRAM Cell

被引:106
|
作者
Islam, A. [1 ]
Hasan, M. [2 ]
机构
[1] Birla Inst Technol, Dept Elect & Commun Engn, Ranchi 835215, Jharkhand, India
[2] Aligarh Muslim Univ, Dept Elect Engn, Aligarh 202002, Uttar Pradesh, India
关键词
Read static noise margin (RSNM); SRAM; standby power; variability; POWER APPLICATIONS; HIGH-SPEED; CMOS; VARIABILITY; DESIGN;
D O I
10.1109/TED.2011.2181387
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a technique for designing a low-power and variability-aware SRAM cell. The cell achieves low power dissipation due to its series-connected tail transistor and read buffers, which offer a stacking effect. This paper studies the impact of process, voltage, and temperature (PVT) variations on most of the design metrics of the SRAM cell and compares the results with standard 6T, 9T, and ST10T (Schmitt trigger based) SRAM cells.
引用
收藏
页码:631 / 638
页数:8
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