On Test Sets Concerning Local Stuck-at Faults of Fixed Multiplicity at the Inputs of Circuits

被引：0
|
作者：
Antyufeev, G. V. [1 ]
Romanov, D. S. [1 ]
机构：
[1] Lomonosov Moscow State Univ, Moscow 119992, Russia
来源：
MATHEMATICAL NOTES | 2023年 / 114卷 / 3-4期
关键词：
Boolean function; detection test set; diagnostic test set; Shannon function; stuck- at faults at the inputs of circuits;
D O I：
10.1134/S0001434623090109
中图分类号：
O1 [数学];
学科分类号：
0701 ; 070101 ;
摘要：
[No abstract available]
引用
收藏
页码：397 / 402
页数：6
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