On Test Sets Concerning Local Stuck-at Faults of Fixed Multiplicity at the Inputs of Circuits

被引：0

作者：

Antyufeev, G. V. ^{[1
]}

Romanov, D. S. ^{[1
]}

机构：

[1] Lomonosov Moscow State Univ, Moscow 119992, Russia

来源：

MATHEMATICAL NOTES | 2023年 / 114卷 / 3-4期

关键词：

Boolean function; detection test set; diagnostic test set; Shannon function; stuck- at faults at the inputs of circuits;

D O I：

10.1134/S0001434623090109

中图分类号：

O1 [数学];

学科分类号：

0701 ; 070101 ;

摘要：

[No abstract available]

引用

页码：397 / 402

页数：6

共 50 条

[1] On Test Sets Concerning Local Stuck-at Faults of Fixed Multiplicity at the Inputs of Circuits
G. V. Antyufeev
D. S. Romanov
Mathematical Notes, 2023, 114 : 397 - 402
[2] DETECTING STUCK-OPEN FAULTS WITH STUCK-AT TEST SETS
MILLMAN, SD
MCCLUSKEY, EJ
PROCEEDINGS OF THE IEEE 1989 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 1989, : 659 - 662
[3] AN ALGORITHM TO GENERATE COMPLETE TEST SETS FOR STUCK-AT FAULTS IN COMBINATIONAL LOGIC-CIRCUITS
TUNG, LJ
KERNS, DV
JOURNAL OF THE FRANKLIN INSTITUTE-ENGINEERING AND APPLIED MATHEMATICS, 1988, 325 (01): : 133 - 142
[4] TEST PATTERN GENERATION FOR STUCK-OPEN FAULTS USING STUCK-AT TEST SETS IN CMOS COMBINATIONAL-CIRCUITS
LEE, HK
HA, DS
KIM, K
26TH ACM/IEEE DESIGN AUTOMATION CONFERENCE, 1989, : 345 - 350
[5] Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits
Peter A. Krauss
Andreas Ganz
Kurt J. Antreich
Journal of Electronic Testing, 1997, 11 : 227 - 245
[6] Distributed test pattern generation for stuck-at faults in sequential circuits
Krauss, PA
Ganz, A
Antreich, KJ
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1997, 11 (03): : 227 - 245
[7] Distributed test pattern generation for stuck-at faults in sequential circuits
Daimler-Benz Aerospace, Munich, Germany
J Electron Test Theory Appl JETTA, 3 (227-245):
[8] UNDETECTABILITY OF BRIDGING FAULTS AND VALIDITY OF STUCK-AT FAULT TEST SETS
KODANDAPANI, KL
PRADHAN, DK
IEEE TRANSACTIONS ON COMPUTERS, 1980, 29 (01) : 55 - 59
[9] Tests with Stuck-At and Shift Faults on Circuit Inputs
Antyufeev G.V.
Romanov D.S.
Computational Mathematics and Modeling, 2020, 31 (4) : 494 - 500
[10] Diagnostics of Stuck-at Faults in Exor Circuits
Autom Control Comput Sci, 2 (17):

← 1 2 3 4 5 →