Atomic Level to Device Level Simulation of Transistor's Reliability

Reliability simulation and design is becoming more and more important with the shrinking of device size and advancing of device architecture. However, the traditional simulation tools are not catching up with the increasing demand on accuracy and universality, due to the strong reliance on empirical/fitted parameters and oversimplified/phenomenological models. It is highly anticipated to improve the traditional tools by integrating with atomistic simulations and by developing more accurate physical models for various reliability issues.