2D X-ray Focusing Device Based on Silicon Planar Refractive Lenses

The paper focuses on developing, manufacturing, and testing a two-dimensional X-ray focusing device based on silicon planar compound refractive lenses. Using compound refractive lenses installed in cross geometry one after another along the optical axis allows for generating a beam with specified parameters. A distinctive feature of the developed device is the ability to correct astigmatism of the optical system. Two-dimensional focusing of X-ray radiation with astigmatism correction was experimentally demonstrated at the RKFM beamline "KISI-Kurchatov." The resulting focused X-ray beam, characterized using the knife-edge technique, had a size of approximately 1.5 mu m, with equal dimensions in both the vertical and horizontal directions. The experimental results were compared with theoretical estimates and computer simulations.