2D X-ray Focusing Device Based on Silicon Planar Refractive Lenses

被引：0
|
作者：
Sorokovikov, M. N. [1 ]
Zverev, D. A. [1 ]
Barannikov, A. A. [1 ]
Astafyev, A. L. [1 ]
Panormov, I. B. [1 ]
Yunkin, V. A. [2 ]
Seregin, A. Y. [3 ,4 ]
Volkovskiy, Y. A. [3 ,4 ]
Prosekov, P. A. [3 ,4 ]
Snigirev, A. A. [1 ]
机构：
[1] Immanuel Kant Balt Fed Univ, Kaliningrad 236041, Russia
[2] Russian Acad Sci, Inst Microelect Technol & High Pur Mat, Chernogolovka 142432, Russia
[3] Natl Res Ctr, Kurchatov Inst, Moscow 123182, Russia
[4] Russian Acad Sci, Shubnikov Inst Crystallog, Fed Sci Res Ctr Crystallog & Photon, Moscow 119333, Russia
来源：
NANOBIOTECHNOLOGY REPORTS | 2024年 / 19卷 / SUPPL1期
关键词：
OPTICS;
D O I：
10.1134/S2635167624602389
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The paper focuses on developing, manufacturing, and testing a two-dimensional X-ray focusing device based on silicon planar compound refractive lenses. Using compound refractive lenses installed in cross geometry one after another along the optical axis allows for generating a beam with specified parameters. A distinctive feature of the developed device is the ability to correct astigmatism of the optical system. Two-dimensional focusing of X-ray radiation with astigmatism correction was experimentally demonstrated at the RKFM beamline "KISI-Kurchatov." The resulting focused X-ray beam, characterized using the knife-edge technique, had a size of approximately 1.5 mu m, with equal dimensions in both the vertical and horizontal directions. The experimental results were compared with theoretical estimates and computer simulations.
引用
收藏
页码：S183 / S190
页数：8
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