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- [22] TEMPERATURE-DEPENDENCE OF ELECTRON-MOBILITY IN SI INVERSION-LAYERS JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (11A): : 2734 - 2739
- [25] OPTICAL MEASUREMENTS OF THE MINIGAPS IN ELECTRON INVERSION-LAYERS ON VICINAL PLANES OF SI(001) PHYSICAL REVIEW B, 1980, 22 (02): : 841 - 847
- [27] PROBE- AND -STRIP METHOD OF MEASURING HALL MOBILITY OF HIGH-RESISTANCE SEMICONDUCTING LAYERS INDUSTRIAL LABORATORY, 1969, 35 (10): : 1436 - &
- [29] TEMPERATURE AND INTERFACE-ROUGHNESS DEPENDENCE OF THE ELECTRON-MOBILITY IN HIGH-MOBILITY SI(100) INVERSION-LAYERS BELOW 4.2-K PHYSICAL REVIEW B, 1991, 43 (08): : 6642 - 6649