Anomalous Hall resistance in Si(001) high mobility inversion layers at high electron concentrations

被引:0
|
作者
Semenchinsky, S. [1 ]
Smrčka, L. [2 ]
Stehno, J. [2 ]
Borzenets, V. [2 ,3 ]
机构
[1] Institute for Metrological Service, 2 Andreevskaya Nab., 117334 Moscow, Russia
[2] Institute of Physics, Acad. of Sci. of the Czech Republic, Cukrovarnická 10, 162 00 Prague 6, Czech Republic
[3] Inst. for Low Temp. Phys. and Eng., 47 Lenin Avenue, Kharkov 310164, Ukraine
关键词
This work was supported by the Grant Agency of the Czech Republic under Contract No. 202/96/0036 and by the Fund for Fundamental Research of Russia through Grant No. 96-02-16838;
D O I
暂无
中图分类号
学科分类号
摘要
9
引用
收藏
页码:335 / 339
相关论文
共 50 条
  • [21] Threading Dislocations in InGaAs/GaAs (001) Buffer Layers for Metamorphic High Electron Mobility Transistors
    Song, Yifei
    Kujofsa, Tedi
    Ayers, John E.
    JOURNAL OF ELECTRONIC MATERIALS, 2018, 47 (07) : 3474 - 3482
  • [22] TEMPERATURE-DEPENDENCE OF ELECTRON-MOBILITY IN SI INVERSION-LAYERS
    MASAKI, K
    TANIGUCHI, K
    HAMAGUCHI, C
    IWASE, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (11A): : 2734 - 2739
  • [23] ELECTRON-MOBILITY ANALYSIS OF NORMAL-SI INVERSION-LAYERS
    VASS, E
    LASSNIG, R
    GORNIK, E
    SURFACE SCIENCE, 1982, 113 (1-3) : 223 - 227
  • [24] HALL MOBILITY OF ELECTRONS IN SILICON SURFACE INVERSION LAYERS
    SUGANO, T
    SAKAKI, H
    HOH, K
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1968, 7 (09) : 1131 - &
  • [25] OPTICAL MEASUREMENTS OF THE MINIGAPS IN ELECTRON INVERSION-LAYERS ON VICINAL PLANES OF SI(001)
    KAMGAR, A
    STURGE, MD
    TSUI, DC
    PHYSICAL REVIEW B, 1980, 22 (02): : 841 - 847
  • [26] Modeling of anomalous electron mobility in Hall thrusters
    Koo, JW
    Boyd, ID
    PHYSICS OF PLASMAS, 2006, 13 (03)
  • [27] PROBE- AND -STRIP METHOD OF MEASURING HALL MOBILITY OF HIGH-RESISTANCE SEMICONDUCTING LAYERS
    KONKOV, VL
    EMELYANO.AI
    YANKINA, AA
    RUBTSOV, RA
    INDUSTRIAL LABORATORY, 1969, 35 (10): : 1436 - &
  • [28] Vertical leakage mechanism in GaN on Si high electron mobility transistor buffer layers
    Choi, F. S.
    Griffiths, J. T.
    Ren, Chris
    Lee, K. B.
    Zaidi, Z. H.
    Houston, P. A.
    Guiney, I.
    Humphreys, C. J.
    Oliver, R. A.
    Wallis, D. J.
    JOURNAL OF APPLIED PHYSICS, 2018, 124 (05)
  • [29] TEMPERATURE AND INTERFACE-ROUGHNESS DEPENDENCE OF THE ELECTRON-MOBILITY IN HIGH-MOBILITY SI(100) INVERSION-LAYERS BELOW 4.2-K
    KRUITHOF, GH
    KLAPWIJK, TM
    BAKKER, S
    PHYSICAL REVIEW B, 1991, 43 (08): : 6642 - 6649
  • [30] THE ANOMALOUS HALL FACTOR IN ELECTRON INVERSION CHANNELS IN GERMANIUM
    DON, KZ
    NEIZVESTNYI, IG
    OVSYUK, VN
    RZHANOV, YA
    JETP LETTERS, 1979, 30 (03) : 174 - 176