CMOS temperature sensors and built-in test circuitry for thermal testing of ICs

被引：0
|
作者：
Technical Univ of Budapest, Budapest, Hungary [1 ]
机构：
来源：
Sens Actuators A Phys | / 1-2卷 / 10-18期
关键词：
The authors wish to acknowledge their gratitude to Zs. Benedek for contributing to the design work of the expeti-mental chips. The financial support of the THERMINIC CP940922 project of the EC; the OMFB 04069/94 and OTKA TO17463 projects of the Hungarian R&D Fund are also acknowledged;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
16
引用
收藏
相关论文
共 50 条
  • [31] UNIVERSAL BUILT-IN SELF-TEST PROCEDURE FOR CMOS PLAS
    ORTEGA, J
    PRIETO, A
    LLORIS, A
    PELAYO, F
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1991, 38 (08): : 941 - 945
  • [32] High-speed 32-channel CMOS VCSEL driver with built-in self-test and clock generation circuitry
    Kiamilev, Fouad E.
    Krishnamoorthy, Ashok V.
    IEEE Journal on Selected Topics in Quantum Electronics, 5 (02): : 287 - 295
  • [33] A high-speed 32-channel CMOS VCSEL driver with built-in self-test and clock generation circuitry
    Kiamilev, FE
    Krishnamoorthy, AV
    IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 1999, 5 (02) : 287 - 295
  • [34] A novel efficient TSV built-in test for stacked 3D ICs
    Guibane, Badi
    Hamdi, Belgacem
    Bensalem, Brahim
    Mtibaa, Abdellatif
    TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES, 2018, 26 (04) : 1909 - 1921
  • [35] Design of a novel all-CMOS built-in temperature sensor
    Lin, Saihua
    Yang, Huazhong
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2006, 27 (03): : 551 - 555
  • [36] Experiences With Non-Intrusive Sensors For RF Built-In Test
    Abdallah, Louay
    Stratigopoulos, Haralampos-G.
    Mir, Salvador
    Kelma, Christophe
    PROCEEDINGS INTERNATIONAL TEST CONFERENCE 2012, 2012,
  • [37] True Non-Intrusive Sensors For RF Built-In Test
    Abdallah, Louay
    Stratigopoulos, Haralampos-G.
    Mir, Salvador
    2013 IEEE INTERNATIONAL TEST CONFERENCE (ITC), 2013,
  • [38] RF Front-End Test Using Built-in Sensors
    Abdallah, Louay
    Stratigopoulos, Haralampos-G.
    Mir, Salvador
    Kelma, Christophe
    IEEE DESIGN & TEST OF COMPUTERS, 2011, 28 (06): : 76 - 84
  • [39] Built-In Self-Heating Thermal Testing of FPGAs
    Amouri, Abdulazim
    Hepp, Jochen
    Tahoori, Mehdi
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2016, 35 (09) : 1546 - 1556
  • [40] BiCMOS thermal sensor circuit for built-in test purposes
    Altet, J
    Rubio, A
    Dilhaire, S
    Schaub, E
    Claeys, W
    ELECTRONICS LETTERS, 1998, 34 (13) : 1307 - 1309
12345