Future of test and DFT

被引：0

作者：

Singer, Gadi ^{[1
]}

机构：

[1] Intel Corp, Santa Clara, United States

来源：

IEEE Design and Test of Computers | 1997年 / 13卷 / 03期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：11 / 14

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