VXI: The test platform of the future?

被引：0

作者：

Greenberg, Charles ^{[1
]}

机构：

[1] EADS N Amer Def Test & Serv, Irvine, CA 92618 USA

来源：

2006 IEEE AUTOTESTCON, VOLS 1 AND 2 | 2006年

关键词：

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

As VME Extensions for Instrumentation (VXI) turns 20 years old, its relevance for new applications is tested in the presence of the alternatives. This paper looks at the past successes and failures of the VXI platform, and then looks at present and future applications with respect to how well the standard holds up. Finally, this paper examines recent VME enhancements, including VITA-41, also known as VXS, to extend the applicability of the VXI platform, looking forward to the next twenty years.

引用

页码：638 / 649

页数：12

共 50 条

[1] VXI-TEST - PROGRAMMABLE SWITCHING WITH VXI - A TUTORIAL
LUM, J
EE-EVALUATION ENGINEERING, 1995, 34 (10): : 47 - &
[2] VXI EVALUATION TEST BED
LYONS, DM
GRAJERA, JM
DINGMANN, DA
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1992, 41 (01) : 144 - 146
[3] An integrated approach to VXI test
Degan, K
Perkins, D
EE-EVALUATION ENGINEERING, 1998, 37 (05): : 24 - +
[4] VXI Technology opens its modular platform
不详
ELECTRONIC DESIGN, 1998, 46 (24) : 21 - 22
[5] VME BECOMES VXI IN TEST AND MEASUREMENT
LABS, W
I&CS-CONTROL TECHNOLOGY FOR ENGINEERS AND ENGINEERING MANAGEMENT, 1987, 60 (09): : 57 - 59
[6] Creep test system of VXI BUS
Wang, Yaorong
Gaojishu Tongxin/High Technology Letters, 1996, 6 (06):
[7] VXI bus - a 21st century platform
EDN, 1997, 44 (24A):
[8] VXI platform reduces compatibility concerns in system design
Beane, M
EE-EVALUATION ENGINEERING, 1998, 37 (06): : 35 - +
[9] The design of radar simulation platform - Based on VXI bus
Zhang, WJ
Wei, ZS
ICEMI'99: FOURTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOLS 1 AND 2, CONFERENCE PROCEEDINGS, 1999, : 265 - 268
[10] VXI products drive down test costs
Dirjish, MA
ELECTRONIC PRODUCTS MAGAZINE, 1998, 40 (10): : 27 - 27

← 1 2 3 4 5 →