VXI: The test platform of the future?

被引：0
|
作者：
Greenberg, Charles [1 ]
机构：
[1] EADS N Amer Def Test & Serv, Irvine, CA 92618 USA
来源：
2006 IEEE AUTOTESTCON, VOLS 1 AND 2 | 2006年
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
As VME Extensions for Instrumentation (VXI) turns 20 years old, its relevance for new applications is tested in the presence of the alternatives. This paper looks at the past successes and failures of the VXI platform, and then looks at present and future applications with respect to how well the standard holds up. Finally, this paper examines recent VME enhancements, including VITA-41, also known as VXS, to extend the applicability of the VXI platform, looking forward to the next twenty years.
引用
收藏
页码：638 / 649
页数：12
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