共 50 条
- [1] GENERATION LIFETIME OF CARRIERS IN METAL-INSULATOR GERMANIUM STRUCTURES SOVIET PHYSICS SEMICONDUCTORS-USSR, 1984, 18 (08): : 939 - 940
- [2] INFLUENCE OF TUNNEL GENERATION PROCESSES ON THE RELAXATION OF THE CAPACITANCE OF METAL-INSULATOR-SEMICONDUCTOR STRUCTURES. Soviet physics. Semiconductors, 1982, 16 (10): : 1134 - 1137
- [5] LIFETIME OF INJECTED CARRIERS IN GERMANIUM PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1952, 40 (11): : 1342 - 1347
- [6] INFLUENCE OF AN INVERSION LAYER ON THE TUNNEL FIELD GENERATION OF CARRIERS IN METAL-INSULATOR SEMICONDUCTOR STRUCTURES SOVIET PHYSICS SEMICONDUCTORS-USSR, 1988, 22 (04): : 445 - 449
- [8] A manifestation of the tunneling conductivity of a thin-gate insulator in the generation kinetics of minority carriers in metal-insulator-semiconductor structures Semiconductors, 2006, 40 : 190 - 196
- [10] INFLUENCE OF DISCRETENESS OF THE SURFACE CHARGE ON THE PROPERTIES OF METAL-INSULATOR-SEMICONDUCTOR STRUCTURES. Soviet physics. Semiconductors, 1983, 17 (08): : 921 - 923