Measuring p-n junction minority carrier diffusion length by microwave photoconductivity spectrum instrument

被引：0
|
作者：
Chu, Youling [1 ]
Wang, Zongxin [1 ]
Wu, Tianfu [1 ]
机构：
[1] Fudan Univ, Shanghai, China
来源：
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 1993年 / 14卷 / 12期
关键词：
Photoelectron spectroscopy;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
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页码：754 / 759
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