Modeling for stuck faults in CMOS non-threshold logic (NTL) combinational circuits

被引：0

作者：

Ismaeel, Asad A. ^{[1
]}

Bhatnagar, Rakesh ^{[1
]}

机构：

[1] Univ of Kuwait, Safat, Kuwait

来源：

Microelectronics Reliability | 1995年 / 35卷 / 04期

关键词：

The authors would like to acknowledge Kuwait UniversityR esearch Unit for their support of this work under grant ECE042;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：669 / 681

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