Modeling for stuck faults in CMOS non-threshold logic (NTL) combinational circuits

被引：0
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作者：
Ismaeel, Asad A. [1 ]
Bhatnagar, Rakesh [1 ]
机构：
[1] Univ of Kuwait, Safat, Kuwait
来源：
Microelectronics Reliability | 1995年 / 35卷 / 04期
关键词：
The authors would like to acknowledge Kuwait UniversityR esearch Unit for their support of this work under grant ECE042;
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摘要：
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页码：669 / 681
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