Improve test compression ratio and reduce test power of EFDR codes by scan chain reconfiguration

被引：0
|
作者：
Department of Computer Science and Technology, Peking University, Beijing 100871, China [1 ]
不详 [2 ]
机构：
来源：
Jisuanji Fuzhu Sheji Yu Tuxingxue Xuebao | 2009年 / 9卷 / 1290-1297期
关键词：
Chains;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] A selective scan chain reconfiguration through run-length coding for test data compression and scan power reduction
    Shi, Y
    Kimura, S
    Yanagisawa, M
    Ohtsuki, T
    IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2004, E87A (12) : 3208 - 3215
  • [2] Scan test cost and power reduction through systematic scan reconfiguration
    Al-Yamani, Ahmad
    Devta-Prasanna, Narendra
    Chmelar, Erik
    Grinchuk, Mikhail
    Gunda, Arun
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2007, 26 (05) : 907 - 918
  • [3] Alternative Run-Length.Coding through scan chain reconfiguration for joint minimization of test data volume and power consumption in scan test
    Shi, YH
    Kimura, S
    Togawa, N
    Yanagisawa, M
    Ohtsuki, T
    13TH ASIAN TEST SYMPOSIUM, PROCEEDINGS, 2004, : 432 - 437
  • [4] Adaptive EFDR coding method for test data compression
    Kuang, Ji-Shun
    Zhou, Ying-Bo
    Cai, Shuo
    Dianzi Yu Xinxi Xuebao/Journal of Electronics and Information Technology, 2015, 37 (10): : 2529 - 2535
  • [5] Scan chain clustering for test power reduction
    Elm, Melanie
    Wunderlich, Hans-Joachim
    Imhof, Michael E.
    Zoellin, Christian G.
    Leenstra, Jens
    Maeding, Nicolas
    2008 45TH ACM/IEEE DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2, 2008, : 828 - +
  • [6] The economics of implementing scan compression to reduce test data volume and test application time
    Allsup, Chris
    2006 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, 2006, : 1003 - +
  • [7] New scan compression approach to reduce the test data volume
    Shantagiri, Pralhadrao V.
    Kapur, Rohit
    Shastry, Chandrasekar
    IET COMPUTERS AND DIGITAL TECHNIQUES, 2021, 15 (04): : 251 - 262
  • [8] A unified solution to reduce test power and test volume for Test-per-scan schemes
    Lei, Shaochong
    Wang, Zhen
    Liu, Zeye
    Liang, Feng
    IEICE ELECTRONICS EXPRESS, 2010, 7 (18): : 1364 - 1369
  • [9] Reducing test power during test using programmable scan chain disable
    Sankaralingam, R
    Touba, NA
    FIRST IEEE INTERNATION WORKSHOP ON ELECTRONIC DESIGN, TEST AND APPLICATIONS, PROCEEDINGS, 2002, : 159 - 163
  • [10] Modeling scan chain modifications for scan-in test power minimization
    Sinanoglu, O
    Orailoglu, A
    INTERNATIONAL TEST CONFERENCE 2003, PROCEEDINGS, 2003, : 602 - 611
12345