Exploration of optical behavior of Cd1-xNixTe thin films by spectroscopic ellipsometry

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[1] Mahmood, Arshad
[2] Aziz, U.
[3] Rashid, R.
[4] Shah, A.
[5] Ali, Zahid
[6] Raza, Qaiser
[7] Raffi, M.
[8] Shakir, Imran
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| 1600年 / IOP Publishing Ltd卷 / 01期
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