Exploration of optical behavior of Cd1-xNixTe thin films by spectroscopic ellipsometry

被引：0
|
作者：
机构：
[1] Mahmood, Arshad
[2] Aziz, U.
[3] Rashid, R.
[4] Shah, A.
[5] Ali, Zahid
[6] Raza, Qaiser
[7] Raffi, M.
[8] Shakir, Imran
来源：
| 1600年 / IOP Publishing Ltd卷 / 01期
关键词：
22;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] Exploration of optical behavior of Cd1-xNixTe thin films by spectroscopic ellipsometry
    Mahmood, Arshad
    Aziz, U.
    Rashid, R.
    Shah, A.
    Ali, Zahid
    Raza, Qaiser
    Raffi, M.
    Shakir, Imran
    MATERIALS RESEARCH EXPRESS, 2014, 1 (04):
  • [2] Exploration of optical behavior of Cd1-xNixTe thin films by spectroscopic ellipsometry
    Mahmood, Arshad
    Aziz, U.
    Rashid, R.
    Shah, A.
    Ali, Zahid
    Raza, Qaiser
    Raffi, M.
    Shakir, Imran
    Materials Research Express, 2015, 1 (04)
  • [3] Quantum confinement effects on Cd1-xNixTe sputtered films
    Alvarez-Fregoso, O
    Zelaya-Angel, O
    Mendoza-Alvarez, JG
    THIN SOLID FILMS, 1998, 317 (1-2) : 330 - 335
  • [4] SOLUBILITY LIMIT OF NI IN CD1-XNIXTE CRYSTALS
    MIOTKOWSKA, S
    MIOTKOWSKI, I
    DYNOWSKA, E
    ACTA PHYSICA POLONICA A, 1994, 86 (05) : 737 - 739
  • [5] Optical constants of polycrystalline Cd1-xZnxTe thin films by spectroscopic ellipsometry
    Rao, KP
    Hussain, OM
    Naidu, BS
    Reddy, PJ
    ADVANCED MATERIALS FOR OPTICS AND ELECTRONICS, 1997, 7 (03): : 109 - 115
  • [6] Determination of optical constants of Cd1-xZnxTe thin films by spectroscopic ellipsometry
    Prabakar, K
    Sridharan, M
    Narayandass, SK
    Mangalaraj, D
    Gopal, V
    THIN SOLID FILMS, 2003, 424 (01) : 66 - 69
  • [7] CHARACTERIZATION OF OPTICAL THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY
    TROLIERMCKINSTRY, S
    CHINDAUDOM, P
    VEDAM, K
    HIREMATH, BV
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1995, 78 (09) : 2412 - 2416
  • [8] Application of spectroscopic ellipsometry to characterization of optical thin films
    Woollam, JA
    Bungay, C
    Yan, L
    Thompson, DW
    Hilfiker, J
    LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2002 AND 7TH INTERNATIONAL WORKSHOP ON LASER BEAM AND OPTICS CHARACTERIZATION, 2003, 4932 : 393 - 404
  • [9] Investigation of the optical behavior of indium oxide thin films with the aid of spectroscopic ellipsometry technique
    Goswami, Sumit
    Sharma, Ashwini Kumar
    APPLIED SURFACE SCIENCE, 2019, 495
  • [10] Optical Properties of BST Thin Films by Spectroscopic Ellipsometry and Optical Reflectivity
    Chvostova, D.
    Zelezny, V.
    Pajasova, L.
    Simek, D.
    Jelinek, M.
    Matej, Z.
    FERROELECTRICS, 2008, 370 : 126 - 131
12345