Charge pumping current from single Si/SiO2 interface traps: Direct observation of Pb centers and fundamental trap-counting by the charge pumping method

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作者：
Interdisciplinary Graduate School of Science and Engineering, Shimane University, Matsue [1 ]
690-8504, Japan
不详 [2 ]
930-8555, Japan
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来源：
Jpn. J. Appl. Phys. | / 4卷
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Compilation and indexing terms; Copyright 2025 Elsevier Inc;
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04DC01
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摘要：
Optical pumping
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