RELIABILITY AND OPTIMIZATION OF WIRE BONDING IN POWER MICROELECTRONIC DEVICES

被引:0
|
作者
El Hami, Norelislam [1 ]
Koulou, Aicha [2 ]
El Hami, Abdelkhalak [3 ]
机构
[1] Science and Engineering Laboratory, ENSA, University Ibn Tofail, Kénitra, Morocco
[2] EST, University Ibn Tofail, Kénitra, Morocco
[3] Laboratory of Mechanics of Normandy, INSA, Rouen, France
来源
Electronic Device Failure Analysis | 2024年 / 26卷 / 03期
关键词
D O I
10.31399/asm.edfa.2024-3.p028
中图分类号
学科分类号
摘要
引用
收藏
页码:28 / 34
相关论文
共 50 条
  • [41] Wire Bonding Power Interconnection
    Novotny, Marek
    Jankovsky, Jaroslav
    Szendiuch, Ivan
    Barton, Zdenek
    ESTC 2008: 2ND ELECTRONICS SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2008, : 383 - +
  • [42] High Reliability Challenges with Cu Wire Bonding for Automotive Devices in the AEC-Q006
    Jeon, Junho
    Na, SeokHo
    Jeon, SungHo
    Mo, Mina
    Kang, DaeByoung
    Lim, Kwangmo
    Kim, JinYoung
    2017 IEEE 67TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2017), 2017, : 1968 - 1973
  • [43] Evaluation of Ag Wire Reliability on Fine Pitch Wire Bonding
    Xi, Jiaqing
    Mendoza, Norbe
    Chen, Kevin
    Yang, Thomas
    Reyes, Edward
    Bezuk, Steve
    Lin, Juln
    Ke, Shenggin
    Chen, Eason
    2015 IEEE 65TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2015, : 1392 - 1395
  • [44] Reliability and lifetime evaluation of different wire bonding technologies for high power IGBT modules
    Hamidi, A
    Beck, N
    Thomas, K
    Herr, E
    MICROELECTRONICS RELIABILITY, 1999, 39 (6-7) : 1153 - 1158
  • [45] Ultrasonic Thick Wire Bonding Process Simulation and Validation for Silicon Carbide Power Devices
    Liu, Pan
    Li, Liangtao
    Zeng, Zejun
    Zhang, Guoqi
    Liu, Pengfei
    Zhang, Jon Qingchun
    Zhang, Jing
    IEEE 71ST ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2021), 2021, : 1786 - 1790
  • [46] Effects of plasma cleaning on the reliability of wire bonding
    Nowful, JM
    Lok, SC
    Lee, SWR
    ADVANCES IN ELECTRONIC MATERIALS AND PACKAGING 2001, 2001, : 39 - 43
  • [47] Reliability characterization of heavy wire bonding materials
    Naumann, F.
    Schischka, J.
    Koetter, S.
    Milke, E.
    Petzold, M.
    2012 4TH ELECTRONIC SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE (ESTC), 2012,
  • [48] RESEARCH ON THE RELIABILITY OF WIRE BONDING IN HUMID ENVIRONMENTS
    Zhang, Xiaowen
    Ling, Xiaolin
    Gao, Ru
    IET Conference Proceedings, 2023, 2023 (09): : 696 - 700
  • [49] A posteriori multiobjective optimization for parameter extraction of microelectronic devices
    Spinella, S
    Anile, AM
    Applied and Industrial Mathematics in Italy, 2005, 69 : 520 - 529
  • [50] Reliability of Cu wire bonding to Al metallization
    England, Luke
    Jiang, Tom
    57TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2007 PROCEEDINGS, 2007, : 1604 - +