Si/SiO2 interface roughness study using Fowler-Nordheim tunneling current oscillations

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作者：

Lai, L. ^{[1
]}

Irene, Gene ^{[1
]}

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[1] Department of Chemistry, Univ. of N. Carolina at Chapel Hill, Chapel Hill, NC 27599-3290, United States

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| 1600年 / American Institute of Physics Inc.卷 / 87期

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[41] A MODIFICATION TO THE FOWLER-NORDHEIM TUNNELING CURRENT CALCULATION FOR THIN MOS STRUCTURES
OH, SJ
YEOW, YT
SOLID-STATE ELECTRONICS, 1988, 31 (06) : 1113 - 1118
[42] DETERMINATION OF THE SI-SIO2 BARRIER HEIGHT FROM THE FOWLER-NORDHEIM PLOT
OLIVO, P
SUNE, J
RICCO, B
IEEE ELECTRON DEVICE LETTERS, 1991, 12 (11) : 620 - 622
[43] Fowler-Nordheim electron tunneling mechanism in Ni/SiO2/n-4H SiC MOS devices
Kodigala, Subba Ramaiah
Chattopadhyay, S.
Overton, C.
Ardoin, I.
SOLID-STATE ELECTRONICS, 2015, 114 : 104 - 110
[44] Fowler-Nordheim tunneling of holes through thermally grown SiO2 on p+ 6H-SiC
Waters, R
Van Zeghbroeck, B
APPLIED PHYSICS LETTERS, 1998, 73 (25) : 3692 - 3694
[45] INFLUENCE OF SILICON SURFACE-POTENTIAL ON THE FOWLER-NORDHEIM TUNNEL INJECTION INTO SIO2
BOUSSE, L
VOUNCKX, R
STEENHAUT, O
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 53 (02): : K215 - K218
[46] ELECTRON TRAP GENERATION IN THERMALLY GROWN SIO2 UNDER FOWLER-NORDHEIM STRESS
ZHANG, JF
TAYLOR, S
ECCLESTON, W
JOURNAL OF APPLIED PHYSICS, 1992, 71 (02) : 725 - 734
[47] Electron trap generation in thermally grown SiO2 under Fowler-Nordheim stress
1600, (71):
[48] Polymer and polymer/metal interface characterization via Fowler-Nordheim tunneling measurements
Hummelgen, IA
Roman, LS
Nart, FC
Peres, LO
Sa, EL
APPLIED PHYSICS LETTERS, 1996, 68 (22) : 3194 - 3196
[49] Electron transport properties of Si nanosheets: Transition from direct tunneling to Fowler-Nordheim tunneling
Ikuno, Takashi
Okamoto, Hirotaka
Sugiyama, Yusuke
Nakano, Hideyuki
Yamada, Fumihiko
Kamiya, Itaru
APPLIED PHYSICS LETTERS, 2011, 99 (02)
[50] POSITIVE AND NEGATIVE CHARGING OF THERMALLY GROWN SIO2 INDUCED BY FOWLER-NORDHEIM EMISSION
ITSUMI, M
JOURNAL OF APPLIED PHYSICS, 1981, 52 (05) : 3491 - 3497

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