Si/SiO2 interface roughness study using Fowler-Nordheim tunneling current oscillations

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Lai, L. [1 ]
Irene, Gene [1 ]
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[1] Department of Chemistry, Univ. of N. Carolina at Chapel Hill, Chapel Hill, NC 27599-3290, United States
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| 1600年 / American Institute of Physics Inc.卷 / 87期
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