Choice of models for the investigation of dielectric film-substrate systems by ellipsometric and spectrophotometric methods

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作者：
Ayupov, B.M. [1 ]
机构：
[1] Institute of Inorganic Chemistry, Siberian Branch of RAS, Novosibirsk, Russia
来源：
Surface Investigation X-Ray, Synchrotron and Neutron Techniques | 2001年 / 16卷 / 04期
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15
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页码：653 / 660
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