Choice of models for the investigation of dielectric film-substrate systems by ellipsometric and spectrophotometric methods

被引：0

作者：

Ayupov, B.M. ^{[1
]}

机构：

[1] Institute of Inorganic Chemistry, Siberian Branch of RAS, Novosibirsk, Russia

来源：

Surface Investigation X-Ray, Synchrotron and Neutron Techniques | 2001年 / 16卷 / 04期

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摘要：

引用

页码：653 / 660

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