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- [1] Single-angle-of-incidence single-element rotating-polarizer (Single SERP) ellipsometer for film-substrate systemsPOLARIZATION SCIENCE AND REMOTE SENSING VI, 2013, 8873Zaghloul, A. R. M.
- [2] SINGLE-ELEMENT ROTATING-POLARIZER ELLIPSOMETER - PSI METERSURFACE SCIENCE, 1980, 96 (1-3) : 168 - 173ZAGHLOUL, ARMAZZAM, RMA
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- [6] Fixed polarizer, rotating-polarizer and fixed analyzer spectroscopic ellipsometer: accurate calibration method, effect of errors and testingTHIN SOLID FILMS, 2002, 406 (1-2) : 103 - 112Naciri, AEBroch, LJohann, LKleim, R
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- [8] ERROR CORRECTION FOR CALIBRATION AND DATA REDUCTION IN ROTATING-POLARIZER ELLIPSOMETRY - APPLICATIONS TO A NOVEL MULTICHANNEL ELLIPSOMETERJOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1991, 8 (06) : 919 - 931NGUYEN, NVPUDLINER, BSAN, ICOLLINS, RW
- [9] POLARIZER-SURFACE-ANALYZER NULL ELLIPSOMETRY FOR FILM-SUBSTRATE SYSTEMSJOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1975, 65 (12) : 1464 - 1471AZZAM, RMAZAGHLOUL, ARMBASHARA, NM
- [10] X-measuring ellipsometer (XME): A novel ellipsometric technique to fully characterize film-substrate systemsADVANCES IN THIN - FILM COATINGS FOR OPTICAL APPLICATIONS III, 2006, 6286Zaghloul, A. R. M.Zaghloul, Y. A.