Improved method for selecting partial scan flip-flops

被引：0
|
作者：
Xiong, Zhiping [1 ]
Yu, Yinlei [1 ]
Huang, Weikang [1 ]
机构：
[1] Dept. of Electron. Eng., Fudan Univ., Shanghai 200433, China
来源：
Jisuanji Fuzhu Sheji Yu Tuxingxue Xuebao/Journal of Computer-Aided Design and Computer Graphics | 2002年 / 14卷 / 03期
关键词：
Computer simulation - Controllability - Observability - Scanning - Sequential circuits;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
An improvement from an existing method based on state density of the sequential loops is presented. It is a comprehensive approach based on fault controllability and observability. The possible timing loss in the partial scan design is also considered. Simulation results on ISCAS 89 benchmark circuits show its good performance. It can reduce the number of selected flip-flops and improve the test effectiveness and fault coverage.
引用
收藏
页码：218 / 221
相关论文
共 50 条
  • [1] AN EXACT ALGORITHM FOR SELECTING PARTIAL SCAN FLIP-FLOPS
    CHAKRADHAR, ST
    BALAKRISHNAN, A
    AGRAWAL, V
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1995, 7 (1-2): : 83 - 93
  • [2] A practical method for selecting partial scan flip-flops for large circuits
    Ghosh, I
    Bhawmik, S
    TENTH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS, 1997, : 284 - 288
  • [3] Selecting partial scan flip-flops for circuit partitioning
    Ono, Toshinobu
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1994, : 646 - 650
  • [4] Layout driven selecting and chaining of partial scan flip-flops
    Chen, CS
    Lin, KH
    Hwang, TT
    33RD DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 1996, 1996, : 262 - 267
  • [5] SELECTION OF THE FLIP-FLOPS FOR PARTIAL ENHANCED SCAN TECHNIQUES
    Matrosova, A. Yu.
    Melnikov, A. V.
    Mukhamedov, R. V.
    Ostanin, S. A.
    Singh, V.
    VESTNIK TOMSKOGO GOSUDARSTVENNOGO UNIVERSITETA-UPRAVLENIE VYCHISLITELNAJA TEHNIKA I INFORMATIKA-TOMSK STATE UNIVERSITY JOURNAL OF CONTROL AND COMPUTER SCIENCE, 2012, 19 (02): : 112 - 120
  • [6] Layout Driven Selection and Chaining of Partial Scan Flip-Flops
    Chau-Shen Chen
    Tingting Hwang
    Journal of Electronic Testing, 1998, 13 : 19 - 27
  • [7] Layout driven selection and chaining of partial scan flip-flops
    Chen, Chau-Shen
    Hwang, Tingting
    Journal of Electronic Testing: Theory and Applications (JETTA), 1998, 13 (01): : 19 - 27
  • [8] Layout driven selection and chaining of partial scan flip-flops
    Chen, CS
    Hwang, T
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1998, 13 (01): : 19 - 27
  • [9] Identification of unsettable flip-flops for partial scan and faster ATPG
    Hartanto, I
    Boppana, V
    Fuchs, WK
    1996 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN - DIGEST OF TECHNICAL PAPERS, 1996, : 63 - 66
  • [10] Level Converting Scan Flip-Flops
    Li, Katherine Shu-Min
    Hsieh, Ming-Hua
    Wang, Sying-Jyan
    ISCAS: 2009 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-5, 2009, : 2505 - +
12345