Improved method for selecting partial scan flip-flops

被引：0

作者：

Xiong, Zhiping ^{[1
]}

Yu, Yinlei ^{[1
]}

Huang, Weikang ^{[1
]}

机构：

[1] Dept. of Electron. Eng., Fudan Univ., Shanghai 200433, China

来源：

Jisuanji Fuzhu Sheji Yu Tuxingxue Xuebao/Journal of Computer-Aided Design and Computer Graphics | 2002年 / 14卷 / 03期

关键词：

Computer simulation - Controllability - Observability - Scanning - Sequential circuits;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

An improvement from an existing method based on state density of the sequential loops is presented. It is a comprehensive approach based on fault controllability and observability. The possible timing loss in the partial scan design is also considered. Simulation results on ISCAS 89 benchmark circuits show its good performance. It can reduce the number of selected flip-flops and improve the test effectiveness and fault coverage.

引用

页码：218 / 221

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