Laser induced removal of spherical particles from silicon wafers

被引:0
|
作者
Lu, Y.F. [1 ]
Zheng, Y.W. [1 ]
Song, W.D. [1 ]
机构
[1] Laser Microprocessing Laboratory, Dept. Elec. Eng. Data Storage Inst., National University of Singapore, Singapore 119260, Singapore
来源
| 1600年 / American Institute of Physics Inc.卷 / 87期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [31] Method to evaluate damage induced by dicing and laser cutting of silicon wafers
    Ebutt, R
    Danyluk, S
    Weisshaus, I
    ADVANCES AND APPLICATIONS IN THE METALLOGRAPHY AND CHARACTERIZATION OF MATERIALS AND MICROELECTRONIC COMPONENTS: PROCEEDINGS OF THE TWENTY-EIGHTH ANNUAL TECHNICAL MEETING OF THE INTERNATIONAL METALLOGRAPHIC SOCIETY, 1996, 23 : 89 - 94
  • [32] Laser Cleaning Technique Using Laser-induced Acoustic Streaming for Silicon Wafers
    Tsai, Chwan-Huei
    Peng, Wen-Shiang
    JOURNAL OF LASER MICRO NANOENGINEERING, 2017, 12 (01): : 1 - 5
  • [33] Aging phenomena in the removal of nano-particles from Si wafers
    Vereecke, G.
    Veltens, J.
    Xu, K.
    Eitoku, A.
    Sano, K.
    Arnauts, S.
    Kenis, K.
    Snow, J.
    Vinckier, C.
    Mertens, P. W.
    ULTRA CLEAN PROCESSING OF SEMICONDUCTOR SURFACES VIII, 2008, 134 : 155 - +
  • [34] Removal versus ablation in KrF dry laser cleaning of polystyrene particles from silicon
    Kudryashov, SI
    Allen, SD
    JOURNAL OF APPLIED PHYSICS, 2002, 92 (09) : 5159 - 5162
  • [35] Removal of Cu and Fe Impurities on Silicon Wafers from Cleaning Solutions
    Kim, In-Jung
    Bae, So-Ik
    KOREAN JOURNAL OF MATERIALS RESEARCH, 2006, 16 (02): : 80 - 84
  • [36] THE REMOVAL OF HYDROCARBONS AND SILICONE GREASE STAINS FROM SILICON-WAFERS
    SHERMAN, R
    WHITLOCK, W
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (03): : 563 - 567
  • [37] Light scattering by metallic particles on silicon wafers
    Anon
    Journal of Research of the National Institute of Standards and Technology, 2002, 107 (04)
  • [38] Polarization of light scattered by particles on silicon wafers
    Sung, LP
    Mulholland, GW
    Germer, TA
    SURFACE CHARACTERIZATION FOR COMPUTER DISKS, WAFERS, AND FLAT PANEL DISPLAYS, 1999, 3619 : 80 - 89
  • [39] Deposition and removal of sodium contamination on silicon wafers
    Constant, I
    Tardif, F
    Derrien, J
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2000, 15 (01) : 61 - 66
  • [40] Laser induced photoresist thin film removal from silicon wafer surface
    Apostol, I
    Damian, V
    Timcu, A
    Iordache, I
    Bianco, M
    Galli, R
    Castex, MC
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2004, 6 (02): : 481 - 484