Compact-parity testing and testable design

被引：1

作者：

Xu, Shi-Yi ^{[1
]}

机构：

[1] School of Computers, Shanghai University, Shanghai 200072, China

来源：

Journal of Dong Hua University (English Edition) | 2005年 / 22卷 / 03期

关键词：

Exhaustive testing - Parity testable design - Pseudo parity testing - Time consuming;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：44 / 50

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