Compact-parity testing and testable design

被引：1
|
作者：
Xu, Shi-Yi [1 ]
机构：
[1] School of Computers, Shanghai University, Shanghai 200072, China
来源：
Journal of Dong Hua University (English Edition) | 2005年 / 22卷 / 03期
关键词：
Exhaustive testing - Parity testable design - Pseudo parity testing - Time consuming;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
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页码：44 / 50
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