Actuation properties of lead zirconate titanate thick films structured on Si membrane by the aerosol deposition method

被引:0
|
作者
Lebedev, Maxim [1 ,3 ]
Akedo, Jun [1 ]
Akiyama, Yoshikazu [2 ]
机构
[1] Mechanical Engineering Laboratory, A.I.S.T., M.I.T.I., 1-2 Namiki, Tsukuba, Ibaraki 305-8564, Japan
[2] R and D Center, RICOH Co., Ltd., 16-1 Shinei, Tsuzuki, Yokohama 224-0035, Japan
[3] JST Cooperative Researcher, 4-1-8 Honmachi, Kawaguchi, Saitama 332-0012, Japan
关键词
Deposition - Interferometers - Laser applications - Lead compounds - Microactuators - Natural frequencies - Semiconducting silicon - Substrates - Thick films;
D O I
10.1143/jjap.39.5600
中图分类号
学科分类号
摘要
The results of the direct deposition of lead zirconate titanate [Pb(Zr0.52, Ti0.48)O3] (PZT) thick film on a Si-based structure are presented. The construction of a bottom electrode is very important for successful deposition. The actuation properties of PZT on the Si membrane were investigated. For a 6.2 × 6.1 mm2, 65-μm-thick Si membrane driven by a 4.7 × 4.3 mm2, 13-μm-thick PZT layer, the deflections, which were 1.5 μm upon applying 52 V at nonresonance frequency and 22 μm upon applying 8 V at resonance frequency, were measured.
引用
收藏
页码:5600 / 5603
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