共 50 条
- [31] Single Event Induced Double Node Upset Tolerant Latch 2010 IEEE 25TH INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS (DFT 2010), 2010, : 280 - 288
- [32] Single Event Transient Event Frequency Prediction Model for a Next Generation PLL NSRE: 2008 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2008, : 85 - 89
- [33] Buffered Count-Min Sketch ADVANCED TECHNOLOGIES, SYSTEMS, AND APPLICATIONS II, 2018, 28 : 249 - 255
- [37] Towards a single event transient hardness assurance methodology 2001 6TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, 2002, : 343 - 350
- [39] Propagation induced pulse broadening of single event transient Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2008, 29 (09): : 1827 - 1831